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5323
Topics: VLSI Testing
Spring 2015
Credits
3
|
Attributes
Graduate
Sections
(2)
EE 5323
Topics: VLSI Testing
23/30
Liu, Bao
MWF 12:00-12:50 PM
EE 5323
Topic in VLSI Design
6/45
John, Eugene
TTh 6:00-7:15 PM
CRN
Title
Instructor
Time
Location
Seats
29049
Topics: VLSI Testing
Liu,
Bao
3.6
M
W
F
12:00 PM · 50 min
MH 3.03.12
23
of 30
29050
Topic in VLSI Design
John,
Eugene
4.2
T
Th
6:00 PM · 1h 15m
MH 3.02.18
6
of 45
Instructors
Bao Liu
3.6
Eugene John
4.2
v0.7.1
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